About the training:
The participants will learn the basics of scanning electron microscopy (SEM) and FIB operations. They will learn about the FIB and SEM applications (cross-section analysis, analysis of defects on a chip, contact deposition, structure etching, 3D tomography, e-beam lithography, lamella fabrication…), and the limitations of the device. The workshop will be interactive, meaning the participants will be able to ask questions, and ask the operator to perform tasks they are most interested in.
What the training focuses on:
FIB capabilities
training is intended for:
Everyone interested in electron microscopy, especially SEM and FIB
Kje:
Online (Zoom link will be provided to participants)
Kdaj:
9 June 2026 at 9:00 AM (CEST)
Organizer:
Kontakt:
E-mail: office@cc-chip.si
Rok za prijavo:
2 June 2026 (until 12:00 PM)
Applications are open and can be submitted via the form below.
