{"id":35780,"date":"2026-09-01T13:00:00","date_gmt":"2026-09-01T13:00:00","guid":{"rendered":"https:\/\/cc-chip.si\/?p=508"},"modified":"2026-10-08T06:29:36","modified_gmt":"2026-10-08T06:29:36","slug":"fib-hands-on-training","status":"publish","type":"post","link":"https:\/\/cc-chip.si\/slo\/fib-hands-on-training\/","title":{"rendered":"FIB hands-on training"},"content":{"rendered":"<h2 class=\"wp-block-heading has-text-color has-link-color wp-elements-1\" style=\"color:#004180\"><strong>12. 10 \u2013 23. 10. 2026<\/strong><\/h2>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<h5 class=\"wp-block-heading\"><strong>About the training:<\/strong><\/h5>\n\n\n\n<p class=\"wp-block-paragraph\">In the first step the trainees will learn the basics of scanning electron microscopy (SEM) and FIB operations. Then they will learn how to perform electron beam lithography using FIB with nanometre precision for the preparation of chips. They will also learn how to perform analysis of defects on chips with the cross-section technique. Defects will be thoroughly analysed using Energy-Dispersive X-Ray Spectroscopy (EDS) chemical analysis and with Scanning Transmission Electron Microscopy (STEM). For detailed 3-D analysis of samples on nanometre scale FIB tomography technique will be demonstrated. If there will be interest, also FIB lamella preparation training is also possible. The trainees will be able to use FIB during training under direct supervision of our instructors.<\/p>\n\n\n\n<h5 class=\"wp-block-heading\"><strong>Who Should Attend?<\/strong><\/h5>\n\n\n\n<p class=\"wp-block-paragraph\">The training is open to anyone interested in electron microscopy. Prior experience with electron microscopy and\/or completion of a graduate- or PhD-level course in the field is recommended but not required.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<h5 class=\"wp-block-heading\">Language: <\/h5>\n\n\n\n<p class=\"wp-block-paragraph\">Slovenian or English<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>When:<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>12. 10 at: 9:00 \u2013 23. 10. 2026 till 12:00<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Where:<\/strong> <\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Nanocenter, Jamova 39, 1000 Ljubljana, Slovenia<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<h5 class=\"wp-block-heading\"><strong>Topics:<\/strong><\/h5>\n\n\n\n<ul class=\"wp-block-list\">\n<li>FIB\/SEM<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<h5 class=\"wp-block-heading\"><strong>Overview of the Programme <\/strong><\/h5>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Day 1 \u2013 FIB Fundamentals &amp; Operation<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Introduction to FIB and FIB\u2013SEM<\/li>\n\n\n\n<li>System components and functions<\/li>\n\n\n\n<li>Safety protocols<\/li>\n\n\n\n<li>FIB Pt deposition and chip fabrication<\/li>\n\n\n\n<li>Practical demonstration<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Day 2 \u2013 Electron Beam Lithography &amp; Defect Analysis<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>EBL fundamentals and nanometer-scale patterning<\/li>\n\n\n\n<li>Practical EBL session using FIB\u2013SEM<\/li>\n\n\n\n<li>Introduction to FIB cross-section techniques<\/li>\n\n\n\n<li>Hands-on defect analysis<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Day 3 \u2013 EDS &amp; Chemical Analysis<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>EDS fundamentals and applications<\/li>\n\n\n\n<li>Practical FIB\u2013SEM\u2013EDS analysis<\/li>\n\n\n\n<li>Point spectra, line scans and elemental mapping<\/li>\n\n\n\n<li>Correlation of structural and chemical information<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Day 4 \u2013 STEM Sample Preparation &amp; Analysis<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Introduction to STEM<\/li>\n\n\n\n<li>FIB preparation of STEM\/TEM lamellae<\/li>\n\n\n\n<li>Lift-out, thinning and final polishing<\/li>\n\n\n\n<li>STEM analysis and common imaging\/analytical modes<\/li>\n<\/ul>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Day 5 \u2013 FIB Tomography &amp; Advanced Techniques<\/strong><\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Introduction to FIB tomography<\/li>\n\n\n\n<li>Slice-and-view 3D analysis<\/li>\n\n\n\n<li>Practical FIB tomography session<\/li>\n\n\n\n<li>FIB lamella preparation <em>(optional\/hands-on if time permits)<\/em><\/li>\n<\/ul>\n\n\n\n<h5 class=\"wp-block-heading\"><strong>Learning Outcomes<\/strong><\/h5>\n\n\n\n<p class=\"wp-block-paragraph\">Student will be able to become FIB operaters.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<h5 class=\"wp-block-heading\"><strong>Additional Information:<\/strong><\/h5>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Cost: <\/strong>Free of charge<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Accreditation and Microcredential<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Participants who successfully complete the course will receive a certificate of participation.<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Organizer:<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">CC Chip.si and the Nanocenter Ljubljana<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Registration:<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">Open until 5. October 2026<\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><strong>Contact:<\/strong><\/p>\n\n\n\n<p class=\"wp-block-paragraph\">E-mail: <a href=\"mailto:office@cc-chip.si\" target=\"_blank\" rel=\"noopener\" title=\"mailto:office@cc-chip.si\">office@cc-chip.si<\/a><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<figure class=\"wp-block-gallery has-nested-images columns-default is-cropped wp-block-gallery-1 is-layout-flex wp-block-gallery-is-layout-flex\">\n<figure class=\"wp-block-image size-full\"><img decoding=\"async\" data-id=\"35787\" src=\"https:\/\/cc-chip.si\/wp-content\/uploads\/2026\/10\/2V1B4024.jpg\" alt=\"\" class=\"wp-image-35787\"\/><\/figure>\n\n\n\n<figure class=\"wp-block-image size-large\"><img fetchpriority=\"high\" decoding=\"async\" width=\"1024\" height=\"683\" data-id=\"35788\" src=\"https:\/\/cc-chip.si\/wp-content\/uploads\/2026\/10\/2V1B4005-1024x683.jpg\" alt=\"\" class=\"wp-image-35788\" srcset=\"https:\/\/cc-chip.si\/wp-content\/uploads\/2026\/10\/2V1B4005-1024x683.jpg 1024w, https:\/\/cc-chip.si\/wp-content\/uploads\/2026\/10\/2V1B4005-300x200.jpg 300w, https:\/\/cc-chip.si\/wp-content\/uploads\/2026\/10\/2V1B4005-768x512.jpg 768w, https:\/\/cc-chip.si\/wp-content\/uploads\/2026\/10\/2V1B4005-1536x1024.jpg 1536w, https:\/\/cc-chip.si\/wp-content\/uploads\/2026\/10\/2V1B4005-2048x1365.jpg 2048w, https:\/\/cc-chip.si\/wp-content\/uploads\/2026\/10\/2V1B4005-18x12.jpg 18w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n<\/figure>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>\n\n\n\n<p class=\"wp-block-paragraph\"><\/p>","protected":false},"excerpt":{"rendered":"<p>12.\u201323. 10. 2026<\/p>\n<p>Hands-on training in scanning electron microscopy and FIB operations.<\/p>","protected":false},"author":1,"featured_media":35787,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[9,8],"tags":[12],"class_list":["post-35780","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-cc-chip-si-trainings","category-trainings","tag-active"],"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/posts\/35780","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/comments?post=35780"}],"version-history":[{"count":5,"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/posts\/35780\/revisions"}],"predecessor-version":[{"id":35878,"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/posts\/35780\/revisions\/35878"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/media\/35787"}],"wp:attachment":[{"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/media?parent=35780"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/categories?post=35780"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/cc-chip.si\/slo\/wp-json\/wp\/v2\/tags?post=35780"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}